Palash Das
VIDWAN ID: 710890

Dr Palash Das

Male Doctor of Philosophy
Assistant Professor | Deparment of Electronics and Communication Engineering (FET)
Cooch Behar Government Engineering College 349
West Bengal
Expertise: Electrical and Electronic Engineering
51 Publications
1 Projects
230 Scopus Citations
209 CrossRef
12 Years Total Experience
Publications
51 Total
Articles
31
Books
1
Chapters
4
Proceedings
15
Activity

No publication activity to display.

Scopus Scopus
230 Citations
9 h-index
CrossRef CrossRef
209 Citations
9 h-index
Google Scholar Google Scholar

Loading Scholar statistics...

Professional Recognition

Regional Best Paper Presentation Award
2026
DSTBT, GoWB, 8th Regional Science and Technology Congress 2026 Region 1

Community & Membership

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

Personal Details

Doctor of Philosophy
2015
Indian Institute of Technology, Ropar
Master of Surgery
2010
Indian Institute of Technology, Ropar
Bachelor of Technology
2003
N/A
Assistant Professor
Oct 2018 – Present
Cooch Behar Government Engineering College 349 | Deparment of Electronics and Communication Engineering (FET)
Assistant Professor
Sep 2014 – Sep 2018
National Institute of Science and Technology (NIST)
Engineering and Technology
Electrical and Electronic Engineering

Related Profiles

Scholarly Work

Micro controller based custom designed overload relay
Completed
Role: Principal Investigator Grant: DSIR/TePP/242/08/67
No Data Found

There is currently nothing to display here.

A System for Customized Universal DC Circuit Emulation and a Method Thereof

1. Palash Das
Aishwarya Singh
Satya Sopan Mahato
Sandipan Mallik
Mrinal Kanti Mandal
- Application No. : 201831035787 Filed : 20-09-2018
Published : 30-11--0001 Published

Solar Augmenter

Magnolia Optical Technologies
Inc.
US
- Patent No. : US10847976B1 Filed : 10-09-2018
Published : 24-11-2020 Granted

Double Quantum Well Nitride High Electron Mobility Transistor (HEMT)

IIT Kharagpur
- Patent No. : 454978 Filed : 13-03-2015
Published : 26-09-2023 Granted

A system and a method for auto responsive intelligent remote monitoring and operating MCC, PDB, LDB panels used in steel, sponge iron, power plants

IIT Kharagpur
- Patent No. : 446078 Filed : 18-09-2013
Published : 21-08-2023 Granted

An Improved Molecular Beam Epitaxy Multi Chamber Cluster Tool and Processes for Integration of Multiple Growth Combination of Group III-V Semiconductor Heterostructures

Dhrubes Biswas
Palash Das
Partha Mukhopadhyay
- Patent No. : 310773 Filed : 01-11-2010
Published : 03-04-2019 Granted

Scholarly Publications

Effects of an ultrathin Si passivation layer on the interfacial properties of RF-sputtered HfYOx on n-GaAs substrates

Journal Article
Semiconductor Science & Technology. Year: 2009. Volume: 24 , Issue: 8 .
Authors: P S Das; A Biswas; C K Maiti

Strained-Si MOSFETs for Low-Power Applications

Conference Paper
ECS Transactions. Year: 2008. Volume: 14 , Issue: 1 , Pages: 203-211 .
Authors: Tapas K. Maiti; Tanmoy Das; Partha S. Das; Subir K. Sarkar; Chinmoy K. Maiti

Characterization of Y 2 O 3 gate dielectric on n-GaAs substrates

Journal Article
Applied Surface Science. Year: 2010. Volume: 256 , Issue: 7 , Pages: 2245-2251 .
Authors: P.S. Das; G.K. Dalapati; D.Z. Chi; A. Biswas; C.K. Maiti

Improved electrical and interfacial properties of RF-sputtered HfAlO x on n-GaAs with effective Si passivation

Journal Article
Applied Surface Science. Year: 2010. Volume: 256 , Issue: 22 , Pages: 6618-6625 .
Authors: P.S. Das; A. Biswas

Charge trapping and reliability characteristics of ultra-thin HfYO x films on n-GaAs substrates

Journal Article
Microelectronics Reliability. Year: 2010. Volume: 50 , Issue: 12 , Pages: 1924-1930 .
Authors: P.S. Das; A. Biswas

Influence of post deposition annealing on Y2O3-gated GaAs MOS capacitors and their reliability issues

Journal Article
Microelectronic Engineering. Year: 2011. Volume: 88 , Issue: 3 , Pages: 282-286 .
Authors: P.S. Das; A. Biswas

Investigation of charge trapping and breakdown characteristics of sputtered-Y2O3 on n-GaAs substrates

Journal Article
Thin Solid Films. Year: 2011. Volume: 520 , Issue: 1 , Pages: 47-52 .
Authors: P.S. Das; Abhijit Biswas

Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlO x on n-GaAs substrates

Conference Paper
Microelectronics Reliability. Year: 2012. Volume: 52 , Issue: 1 , Pages: 112-117 .
Authors: P.S. Das; Abhijit Biswas
Showing 1 to 8 of 51 publications