Juzer Mohsin Vasi
VIDWAN ID: 11176

Dr Juzer Mohsin Vasi

Male Doctor of Philosophy
Professor | Department of Electrical Engineering
Indian Institute of Technology, Bombay
Maharashtra
Expertise: Electrical and Electronic Engineering
145 Publications
0 Projects
1678 Scopus Citations
1513 CrossRef
43 Years 8 Months Total Experience
Publications
145 Total
Articles
81
Books
1
Chapters
1
Proceedings
62
Activity

No publication activity to display.

Scopus Scopus
1,678 Citations
22 h-index
CrossRef CrossRef
1,513 Citations
20 h-index
Google Scholar Google Scholar

Loading Scholar statistics...

Professional Recognition

Fellow
The Institution of Electronics and Telecommunication Engineers (IETE)
Fellow
The Indian National Academy of Engineering (INAE)
Fellow
Institute of Electrical and Electronics Engineers(IEEE)
Lifetime Achievement Award
2013
Indian Institute of Technology Bombay

Community & Membership

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

Personal Details

Doctor of Philosophy
1973
N/A
Professor
Jan 1983 – Present
Indian Institute of Technology, Bombay | Department of Electrical Engineering
Engineering and Technology
Electrical and Electronic Engineering

Related Profiles

Scholarly Work

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

No Data Found

There is currently nothing to display here.

Scholarly Publications

NOVEL DOUBLE DIELECTRIC TWO PHASE CCD WITH OVERLAPPING GATES.

Journal Article
Year: 1979. Volume: 9 , Issue: 4 , Pages: 24-26 .

Determination of surface state distribution from pulsed MOS capacitor transients

Journal Article
Solid-State Electronics. Year: 1979. Volume: 22 , Issue: 1 , Pages: 29-32 .
Authors: Lalita Manchanda; J. Vasi; A.B. Bhattacharyya

SIGNAL-PROCESSING APPLICATIONS OF CHARGE-COUPLED DEVICES.

Journal Article
Year: 1978. Volume: 24 , Issue: 10-11 , Pages: 400-418 .

Data and modelling for HCl oxidation of silicon

Journal Article
Year: 1995. Volume: 76 , Pages: 29-32 .

Capture cross-section of hole traps in reoxidized nitrided oxide measured by irradiation

Journal Article
Solid-State Electronics. Year: 1995. Volume: 38 , Issue: 10 , Pages: 1851-1853 .
Authors: A Mallik; A.N Chandorkar; J Vasi

The nature of the hole traps in reoxidized nitrided oxide gate dielectrics

Journal Article
Journal of Applied Physics. Year: 1993. Volume: 74 , Issue: 4 , Pages: 2665-2668 .
Authors: A. Mallik; J. Vasi; A. N. Chandorkar

Electron Trapping During Irradiation in Reoxidized Nitrided Oxide

Journal Article
IEEE Transactions on Nuclear Science. Year: 1993. Volume: 40 , Issue: 6 , Pages: 1380-1387 .
Authors: A. Mallik; J. Vasi; A.N. Chandorkar

A study of radiation effects on reoxidized nitrided oxide MOSFETs, including effects on mobility

Journal Article
Solid-State Electronics. Year: 1993. Volume: 36 , Issue: 9 , Pages: 1359-1361 .
Authors: A. Mallik; J. Vasi; A.N. Chandorkar
Showing 1 to 8 of 145 publications