Authors: K. Vinod Kumar; J. Pundareekam Goud; Kanaka Ravi Kumar; K. C. James Raju; S. V. S. Nageswara Rao
Effects of ion irradiation induced phase transformations and oxygen vacancies on the leakage current characteristics of HfO2 thin films deposited on GaAs
Authors: N. Arun; L. D. Varma Sangani; K. Vinod Kumar; A. Mangababu; M. Ghanashyam Krishna; A. P. Pathak; S. V. S. Nageswara Rao
120 MeV Ag ion irradiation induced intermixing, grain fragmentation in HfO2/GaOx thin films and consequent effects on the electrical properties of HfO2/GaOx/Si-based MOS capacitors