Physical Modeling of Gallium Nitride High Electron Mobility Transistor (GaN-HEMT) with Field Plate Structure of High Power, High frequency & Highly efficient Power Amplifiers
Completed
Agency: Defence Research and Development OrganisationRole: Other
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Scholarly Publications
Polarization dependent charge control model for microwave performance assessment of AlGaN/GaN/AlGaN double heterostructure HEMTs
Authors: Nisha Chugh; Monika Bhattacharya; Manoj Kumar; S. S. Deswal; R. S. Gupta
Impact of donor-layer doping thickness, gate-length and temperature on potential and electron concentration in AlGaN/GaN Double-Heterostructure and Single-Heterostructure HEMT
Conference Paper
Year: 2018.
Authors: Nisha Chugh; Manoj Kumar; Monika Bhattacharya; R. S. Gupta
Potential and electric field analysis of field plated AlGaN/GaN HEMT for high voltage applications using 2-D analytical approach
Impact of Donor Layer Thickness, Doping Concentration and Gate-Width on Gate-Capacitance of AlGaN/GaN Single and Double Heterostructure HEMT for Microwave Frequency Applications
Conference Paper
Year: 2018.
Pages: 207-212
.
Authors: Chugh, N.; Bhattacharya, M.; Kumar, M.; Gupta, R.S.
RF Performance comparison of Dual Material Gate (DMG) and Conventional AlGaN/GaN High Electron Mobility Transistor
Conference Paper
Year: 2019.
Pages: 137-142
.
Authors: Chugh, N.; Kumar, M.; Bhattacharya, M.; Gupta, R.S.