SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
Guwahati
Assam
IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY)
New Delhi
IN | INDIAN INSTITUTE OF TECH GUWAHATI | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH DEITY
-
Patent No. :
US20200024727A1
Filed :
12-06-2018
Published :
23-01-2020
Published
A SYSTEM AND METHOD FOR LASER BEAM SCANNING WITH PERIODIC SWITCHING OF POLARIZATION OF THE BEAM
INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
-
Patent No. :
IN201831006652A
Filed :
21-02-2018
Published :
23-08-2019
Published
FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY
New Delhi
IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
Assam Guwahati
IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH | INDIAN INSTITUTE OF TECH GUWAHATI
-
Patent No. :
US20190013865A1
Filed :
16-01-2018
Published :
10-01-2019
Published
SYSTEM, VORRICHTUNG UND VERFAHREN ZUR ÜBERWACHUNG EINES OBERFLÄCHENPROFILS UND DICKENMESSUNG IN DÜNNSCHICHTEN | SYSTÈME, APPAREIL ET PROCÉDÉ DE SURVEILLANCE DE PROFIL DE SURFACE ET DE MESURE D'ÉPAISSEUR DANS DES COUCHES MINCES | SYSTEM, APPARATUS AND METH
Secretary Department of Electronics and Information Technology (Deity)
New Delhi 110003
IN
101637428 | Indian Institute of Technology Guwahati
Guwahati
Assam 781039
IN
101637247
-
Patent No. :
EP3387482A1
Filed :
18-07-2016
Published :
17-10-2018
Published
SYSTÈME, APPAREIL ET PROCÉDÉ DE SURVEILLANCE DE PROFIL DE SURFACE ET DE MESURE D'ÉPAISSEUR DANS DES COUCHES MINCES | SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY)
IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
IN
-
Patent No. :
WO2017098343A1
Filed :
18-07-2016
Published :
15-06-2017
Published
用于薄膜中的表面轮廓和厚度测量的监测的系统、装置和方法 | system, device and method for monitoring surface profile and thickness measurement in the film
印度电子与信息技术部(DEITY) | 印度理工学院古瓦哈提分校 | The Secretary Department Of Electronics And Information Technology (deity)
IN | Indian Institute Of Technology Guwahati
-
Patent No. :
CN108700738A
Filed :
18-07-2016
Published :
23-10-2018
Published
OPTISCHES FREIRAUMKOMMUNIKATIONSSYSTEM, VORRICHTUNG UND VERFAHREN DAFÜR | SYSTÈME DE COMMUNICATION OPTIQUE EN ESPACE LIBRE, APPAREIL, ET PROCÉDÉ ASSOCIÉ | FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
Secretary Department of Electronics and Information Technology (Deity)
New Delhi 110003
IN
101637428 | Indian Institute of Technology Guwahati
Guwahati
Assam 781039
IN
101637247
-
Patent No. :
EP3323127A2
Filed :
15-07-2016
Published :
23-05-2018
Published
SYSTÈME DE COMMUNICATION OPTIQUE EN ESPACE LIBRE, APPAREIL, ET PROCÉDÉ ASSOCIÉ | FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY)
IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
IN
-
Patent No. :
WO2017009808A2
Filed :
15-07-2016
Published :
19-01-2017
Published
자유 공간 광 통신 시스템, 장치 및 방법 | OMITTED
더 세크리터리 디파트먼트 오브 일렉트로닉스 앤드 인포메이션 테크놀로지 (데이티)
IN | 인디안 인스티튜트 오브 테크놀로지 구와하티
IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY)
IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
IN
-
Patent No. :
KR2018032606A
Filed :
15-07-2016
Published :
30-03-2018
Published
SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY) | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
-
Patent No. :
IN201504088I1
Filed :
12-12-2015
Published :
16-06-2017
Published
FREE SPACE OPTICAL COMMUNICATION SYSTEM APPARATUS AND A METHOD THEREOF
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY) | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
-
Patent No. :
IN201502153I1
Filed :
15-07-2015
Published :
20-01-2017
Published
A METHOD AND DEVICE FOR ZONAL WAVEFRONT SENSING BY BEAM SPLITTING
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY) | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
-
Patent No. :
IN201403935I1
Filed :
26-12-2014
Published :
01-07-2016
Published
A METHOD AND DEVICE FOR ZONAL WAVEFRONT SENSING VIA SEQUENCIAL SPATIALLY SHIFTED GRATING ARRAY PATTERNS
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY) | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI
-
Patent No. :
IN201403752I1
Filed :
18-12-2014
Published :
24-06-2016
Published