Jaynarayan T Tudu
VIDWAN ID: 110477

Dr Jaynarayan T Tudu

Male Doctor of Philosophy
Assistant Professor | Department of Computer Science and Engineering
Indian Institute of Technology, Tirupati
Andhra Pradesh
Expertise: Computer Science Information Systems
34 Publications
0 Projects
149 Scopus Citations
122 CrossRef
8 Years 5 Months Total Experience
Publications
34 Total
Articles
2
Books
1
Proceedings
31
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Scopus Scopus
149 Citations
7 h-index
CrossRef CrossRef
122 Citations
6 h-index
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Personal Details

Doctor of Philosophy
2016
Indian Institute of Technology, Delhi
Master of Surgery
2010
N/A
Assistant Professor
Apr 2018 – Present
Indian Institute of Technology, Tirupati | Department of Computer Science and Engineering
Engineering and Technology
Computer Science Information Systems

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Scholarly Publications

Physical-Design Aware Scan Cell Reordering for Low Power Testing

Conference Paper
Year: 2024.
Authors: Rohit Badjatya; Vinay; Rahul Kumar; Jaynarayan T Tudu; Masahiro Fujita; Virendra Singh

AI-Driven Power Gating for Enhanced Energy Efficiency in Superscalar Processors

Conference Paper
Year: 2024. Issue: 2024 , Pages: 155-156 .
Authors: Naman Kalra; Jaynarayan T Tudu

SiFFS: A Scalable in-Fault Functional Simulation Framework for Fault Criticality Analysis

Conference Paper
Year: 2025.

Distant History Branch Prediction Using Advanced Machine Learning Techniques

Conference Paper
Year: 2025. Pages: 223-224 .
Authors: Bonthu Purnanand; Jaynarayan T Tudu

RL-Driven Fine-Grained Power Gating for Modern Processors Using Multi-Layer Perceptron Models

Conference Paper
Year: 2025.
Authors: Naman Kalra; Jaynarayan T Tudu

SCALER: Sensitivity-Centric Adaptive Layer Execution & Runtime Mapping for Hybrid Analog-Digital Accelerator

Open Access
Conference Paper
Year: 2026. Pages: 481-489 .
Authors: Naman Kalra; Bonthu Purna Nand; Jaynarayan T. Tudu

A SAT-hard Compound Logic Locking Scheme with Empirical Resistance to Known Structural Attacks

Conference Paper
Year: 2026.
Authors: Sonali Shukla; Govind Rajhans Jadhav; Durgesh Sardan; Suryakant Toraskar; Jaynarayan T Tudu; Makoto Ikeda; Masahiro Fujita; Virendra Singh

Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing

Conference Paper
Year: 2024. Pages: 712-717 .
Authors: R S Haripriya; Soumitro Vyapari; Jaynarayan T Tudu
Showing 1 to 8 of 34 publications