Tanusree Kaibartta
VIDWAN ID: 97543

Prof Tanusree Kaibartta

Female Doctor of Philosophy
Assistant Professor | Department of Computer Science and Engineering
Indian Institute of Technology (Indian School of Mines), Dhanbad
Jharkhand
Expertise: Computer Science Hardware and Architecture
9 Publications
0 Projects
18 Scopus Citations
16 CrossRef
13 Years 3 Months Total Experience
Publications
9 Total
Articles
3
Proceedings
6
Activity

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Scopus Scopus
18 Citations
3 h-index
CrossRef CrossRef
16 Citations
2 h-index
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Personal Details

Doctor of Philosophy
2023
N/A
Assistant Professor
Jun 2013 – Present
Indian Institute of Technology (Indian School of Mines), Dhanbad | Department of Computer Science and Engineering
Engineering and Technology
Computer Science Hardware and Architecture

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Scholarly Work

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Scholarly Publications

A Genetic Algorithm-Based Metaheuristic Approach for Test Cost Optimization of 3D SIC

Open Access
Journal Article
IEEE Access. Year: 2021. Volume: 9 , Pages: 160987-161002 .
Authors: Tanusree Kaibartta; G. P. Biswas; Arup Kumar Pal; Debesh Kumar Das

Heuristic Approach for Identification of Random TSV Defects in 3D IC during Pre-bond Testing

Conference Paper
Year: 2020. Volume: 2020-November .
Authors: Tanusree Kaibartta; G P Biswas; Debesh K Das

Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs

Journal Article
Journal of Electronic Testing. Year: 2020. Volume: 36 , Issue: 2 , Pages: 239-253 .
Authors: Tanusree Kaibartta; G. P. Biswas; Debesh Kumar Das

Optimizing test time for core-based 3-D integrated circuits by genetic algorithm

Conference Paper
Year: 2015. Pages: 62-67 .
Authors: Kaibartta, T.; Giri, C.; Rahaman, H.; Das, D.K.

Approach of genetic algorithm for power-aware testing of 3D IC

Journal Article
IET Computers & Digital Technique. Year: 2019. Volume: 13 , Issue: 5 , Pages: 383-396 .
Authors: Kaibartta, T.; Giri, C.; Rahaman, H.; Das, D.K.

A Novel TSV Repair Framework for 3-D Stacked ICs

Conference Paper
Year: 2024. Pages: 1-6 .
Authors: Kaibartta, T.; Murmu, R.; Das, D.K.

Genetic Algorithm Based Efficient Grouping Technique for Post Bond Test and Crosstalk Faults among TSVs

Conference Paper
Year: 2024. Pages: 730-735 .
Authors: Kaibartta, T.; Arora, H.; Das, D.K.

Optimization of Test Wrapper Length for TSV Based 3D SOCs Using a Heuristic Approach

Conference Paper
Year: 2019. Pages: 310-321 .
Authors: Kaibartta, T.; Das, D.K.
Showing 1 to 8 of 9 publications