Ministry of Education
GAMPA V P CHANDRA SEKHAR YADAV
VIDWAN ID: 663313

Dr GAMPA V P CHANDRA SEKHAR YADAV

Male Chartered Accountancy
Assistant Professor (Senior Grade)
AMRITA VISHWA VIDYAPEETHAM AMARAVATI CAMPUS
Andhra Pradesh
Expertise: Materials Science Composites
ORCID 0000-0002-0037-1632 Scopus 57211331219 ResearcherID AAV-7486-2020 Google Scholar P5XCIGcAAAAJ
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8 Publications
0 Projects
21 Scopus Citations
39 CrossRef
11 Years 2 Months Total Experience
Publications
8 Total
Articles
7
Chapters
1
Activity

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Scopus Scopus
21 Citations
3 h-index
CrossRef CrossRef
39 Citations
3 h-index
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Professional Recognition

NPTEL Elite + Silver (Network Analysis
2025
NPTEL-IIT Kharagpur
NPTEL Elite + Silver (Introduction to IoT
2025
NPTEL-IIT Kharagpur
NPTEL Elite + Gold Topper 2% (Signals and Systems
2026
NPTEL-IIT Mandi
GATE 2026 (ECE
2026
IIT Guwahati

Community & Membership

Teaching and Evaluation Process
Institute Criteria II Co ordinator
Jan 2022
Internal Quality Assurance Cell
Department Co ordinator
Jan 2022
Training and Placement Cell
Department Co ordinator
Jan 2015
Project Co ordinator
Department Co ordinator
Jan 2021
Additional IQAC Co ordinator
Institute Co ordinator
Jan 2026
International Society for Research and Development (ISRD)
M4150901517
Jan 2016
International Association of Engineers (IAENG)
170396
Jan 2016
Universal Association of Computer and Electronics Engineers UACEE
AM10100056546
Jan 2016

Personal Details

Chartered Accountancy
2026
Indian Institute of Technology, Ropar
Doctor of Philosophy
2025
N/A
Master of Technology
2015
N/A
Bachelor of Technology
2012
N/A
Secondary School Examination (Class 10)
2006
N/A
Assistant Professor (Senior Grade)
May 2026 – Present
AMRITA VISHWA VIDYAPEETHAM AMARAVATI CAMPUS
Associate Professor
Oct 2021 – May 2026
DVR & Dr. HS MIC College of Technology
Junior Research Fellow
Nov 2018 – Oct 2021
Koneru Lakshmaiah Education Foundation,Guntur
Assistant Professor
Jul 2015 – Oct 2018
DVR & Dr. HS MIC College of Technology
Engineering and Technology
Materials Science Composites

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Scholarly Work

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DEVICE FOR DETECTING DISEASED LEAVES IN PLANT BY IMAGE PROCESSING

Dr. Gampa V P Chandra Sekhar Yadav
Dr. Nageswararao Malisetti
Mrs. G. Susmitha
Mr. R. Hari Prasada Rao
Mrs. G. Anantha Lakshmi
Mr. T. Narendra Kumar
Mrs. Sridevi Tatikonda
Mr. T. Vijaya kanth
Mrs. G. Bhargavi
- Application No. : 483913-001 Filed : 15-12-2025
Published : 06-02-2026 Published

SYSTEM AND METHOD FOR ESTIMATION OF THICKNESS OF COATING USING QUADRATIC FREQUNECY MODULATED THERMALWAVE IMAGING

Dr. Ghali Venkata Subbarao
G. V. P. Chandra Sekhar Yadav
- Application No. : 201941016189 Filed : 23-04-2019
Published : 03-05-2019 Published

Scholarly Publications

Deep learning-based sustainable subsurface anomaly detection in Barker-coded thermal wave imaging

Journal Article
The International Journal of Advanced Manufacturing Technology. Year: 2023. Volume: 127 , Issue: 7-8 , Pages: 3625-3635 .
Authors: Parvez, M.; Mohammad, A.B.; Ghali, V.S.R.; Yadav, G.C.S.; Vesala, G.T.; Lakshmi, A.V.; Alagarsamy, A.; Palanisamy, S.; Kechagias, J.; Santulli, C.
DOI 10.1007/s00170-023-11753-y Crossref Crossref: 2 Scopus Scopus: 5

Machine learning based automatic defect detection in non stationary thermal wave imaging

Journal Article
Year: 2020.
Authors: Vijayalakshmi, A.; Ghali, V.S.; Chandrasekhar Yadav, G.V.P.; Gopitilak, V.; Muzammil Parvez, M.
Scopus Scopus: 10

Time-Frequency Based Thermal Imaging: An Effective Tool for Quantitative Analysis

Journal Article
Russian Journal of Nondestructive Testing. Year: 2023. Volume: 59 , Issue: 11 , Pages: 1165-1176 .
Authors: Sekhar Yadav, G.V.P.C.; Ghali, V.S.; Subhani, S.K.
DOI 10.1134/S1061830923600752 Crossref Crossref: 4 Scopus Scopus: 5

Defect Detection using Depth Resolvable Statistical Post Processing in Non-Stationary Thermal Wave Imaging

Journal Article
Journal of Information Systems and Telecommunication (JIST). Year: 2022. Volume: 10 , Issue: 38 , Pages: 132-140 .
Authors: Yadav, G.V.P.C.S.; Ghali, V.S.; Baloji, N.R.
DOI 10.52547/jist.15690.10.38.132

A Time Frequency-Based Approach for Defect Detection in Composites Using Nonstationary Thermal Wave Imaging

Journal Article
Russian Journal of Nondestructive Testing. Year: 2021. Volume: 57 , Issue: 6 , Pages: 486-499 .
Authors: Chandra Sekhar Yadav, G.V.P.; Ghali, V.S.; Baloji, N.R.
DOI 10.1134/S1061830921060061 Crossref Crossref: 6

Proper Orthogonal Decomposition-Based Coating Thickness Estimation in Quadratic Frequency Modulated Thermal Wave Imaging

Book Chapter
Year: 2021. Pages: 51-61 .
Authors: G. T. Vesala; G. V. P. Chandra Sekhar Yadav; V. S. Ghali; B. Suresh; R. B. Naik
DOI 10.1007/978-981-16-0186-6_6 Crossref Crossref: 1 Scopus Scopus: 1

Defect characterisation using pulse compression-based quadratic frequency modulated thermal wave imaging

Journal Article
IET Science, Measurement & Technology. Year: 2020. Volume: 14 , Issue: 2 , Pages: 165-172 .
Authors: Subhani, S.; Chandra Sekhar Yadav, G.V.P.; Ghali, V.S.
DOI 10.1049/iet-smt.2019.0118 Crossref Crossref: 26

Bartlett windowed quadratic frequency modulated thermal wave imaging

Journal Article
Year: 2019. Volume: 7 , Issue: 11 , Pages: 512-516 .
Authors: Lakshmi, R.J.; Sairam, S.N.; Mounika, G.; Jayaram, N.; Tilak, V.G.; Chandra Sekhar Yadav, G.V.P.; Ghali, V.S.
DOI 10.30534/ijeter/2019/187112019