SYSTEM AND METHOD FOR A HALL SENSOR-SUPERCONDUCTOR BASED LIMITER OF FAULT CURRENT
INDIAN INSTITUTE OF TECHNOLOGY KANPUR
IN
-
Patent No. :
IN202011011934A
Filed :
19-03-2020
Published :
27-03-2020
Published
SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN THE SAMPLE
INDIAN INSTITUTE OF TECHNOLOGY KANPUR
Uttar Pradesh
IN | Banerjee Satyajit
Kanpur
IN | Mohan Shyam
Kanpur
IN | Sinha Jaivardhan
Kanpur
IN | BANERJEE SATYAJIT | MOHAN SHYAM | SINHA JAIVARDHAN | INDIAN INSTITUTE OF TECHNOLOGY KANPUR
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Patent No. :
US20140176698A1
Filed :
12-03-2014
Published :
26-06-2014
Published
SYSTÈMES ET PROCÉDÉS POUR LA CAPTURE D'IMAGES DES CARACTÉRISTIQUES D'UN ÉCHANTILLON ET POUR L'IDENTIFICATION DE RÉGIONS ENDOMMAGÉES DANS L'ÉCHANTILLON | SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN T
INDIAN INSTITUTE OF TECHNOLOGY KANPUR
IN | BANERJEE Satyajit
IN | MOHAN Shyam
IN | SINHA Jaivardhan
IN
-
Patent No. :
WO2012049538A1
Filed :
29-11-2010
Published :
19-04-2012
Published
샘플의 특징을 이미징하고 샘플 내 손상 영역을 식별하기 위한 시스템 및 방법 | SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN THE SAMPLE
인디안 인스티튜트 오브 테크놀로지 칸푸르
IN | INDIAN INSTITUTE OF TECHNOLOGY KANPUR
IN
-
Patent No. :
KR1442055B1
Filed :
29-11-2010
Published :
18-09-2014
Published
SYSTEMS AND METHODS FOR IMAGING CHARACTERISTICS OF A SAMPLE AND FOR IDENTIFYING REGIONS OF DAMAGE IN THE SAMPLE
INDIAN INSTITUTE OF TECHNOLOGY KANPUR
-
Patent No. :
IN201002433I1
Filed :
12-10-2010
Published :
03-01-2014
Published
Switch useful at superconducting temperatures and comprising superconducting material
NEC Research Institute
Inc.
Princeton
NJ (US); Tata Institute of Fundamental Research; TPPED (Technical Pyhsics & Prototype Engineering Division)
both of Mumbai (IN)
-
Patent No. :
US 6,184,765 B1
Filed :
07-01-1999
Published :
30-11--0001
Granted