Authors: J. Falta; Th. Schmidt; S. Gangopadhyay; Chr. Schulz; S. Kuhr; N. Berner; J. I. Flege; A. Pretorius; A. Rosenauer; K. Sebald; H. Lohmeyer; J. Gutowski; S. Figge; T. Yamaguchi; D. Hommel
Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias