Authors: T. A. Peterson; S. J. Patel; C. C. Geppert; K. D. Christie; A. Rath; D. Pennachio; M. E. Flatté; P. M. Voyles; C. J. Palmstrøm; P. A. Crowell
High resolution transmission electron microscopy studies of ion beam induced modifications in gold nanostructures on silicon: Sputtering and enhanced diffusion
Book Chapter
Year: 2012.
Pages: 181-202
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Structural phase transitions in Au thin films on Si (1 1 0): An in situ temperature dependent transmission electron microscopy study