Kapil Sharma
VIDWAN ID: 169604

Mr Kapil Sharma

Male Doctor of Philosophy
Uttarakhand
Expertise: Mechanical Engineering
128 Publications
0 Projects
880 Scopus Citations
1471 CrossRef
Publications
128 Total
Articles
96
Books
1
Chapters
8
Proceedings
23
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Scopus Scopus
880 Citations
10 h-index
CrossRef CrossRef
1,471 Citations
17 h-index
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Personal Details

Doctor of Philosophy
2025
Jawaharlal Nehru University
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Engineering and Technology
Mechanical Engineering

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Scholarly Publications

Microwave-assisted efficient extraction of different parts of Hippophae rhamnoides for the comparative evaluation of antioxidant activity and quantification of its phenolic constituents by reverse-phase high-performance liquid chromatography (RP-HPLC)

Journal Article
Journal of Agricultural and Food Chemistry. Year: 2008. Volume: 56 , Issue: 2 , Pages: 374-379 .
Authors: Sharma, U.K.; Sharma, K.; Sharma, N.; Sharma, A.; Singh, H.P.; Sinha, A.K.

Bayesian analysis of some static system models

Journal Article
Journal of Quality in Maintenance Engineering. Year: 2004. Volume: 10 , Issue: 4 , Pages: 273-281 .
Authors: Sharma, K.K.; Rathi, S.; Namita

Bayes estimation of the mixture of hazard-rate model

Journal Article
Reliability Engineering & System Safety. Year: 1997. Volume: 55 , Issue: 1 , Pages: 9-13 .
Authors: Sharma, K.K.; Krishna, H.; Singh, B.

Distribution-free inferences on system reliability

Journal Article
Journal of Quality in Maintenance Engineering. Year: 1997. Volume: 3 , Issue: 3 , Pages: 209-215 .
Authors: Sharma, K.K.; Singh, B.

On the uniformly minimum variance unbiased estimator of availability with type I censored data

Journal Article
Microelectronics Reliability. Year: 1996. Volume: 36 , Issue: 2 , Pages: 269-271 .
Authors: Krishna, H.; Sharma, K.K.

Bayes estimates of pointwise and interval availability with type I censored samples

Journal Article
Microelectronics Reliability. Year: 1995. Volume: 35 , Issue: 1 , Pages: 33-36 .
Authors: Krishna, H.; Sharma, K.K.

Inferences on availability ratio

Journal Article
Microelectronics Reliability. Year: 1995. Volume: 35 , Issue: 1 , Pages: 105-108 .
Authors: Krishna, H.; Sharma, K.K.

Non-parametric distribution of the reliability function for some basic system configurations

Journal Article
Microelectronics Reliability. Year: 1995. Volume: 35 , Issue: 1 , Pages: 37-39 .
Authors: Sharma, K.K.; Krishna, H.
Showing 1 to 8 of 128 publications